Technical Capacity
Test & Measurement Accessories System design assistance relates to microscopy optics (light, laser, charged particle, e-beam, ion-beam) scanning electron microscope laser scanning microscope mass spectrometer (ion trap, quadrupole, TOF) laser detector silicon electron detector (PIN diodes), microchannel plates (MCP) photomultiplier (PMT) Custom Design Analog/Mixed-Domain Electronics for instruments Low noise electronics transimpedance amplifier (TIA) fast settling detection driver ultra-low noise current driver RF driver for mass spectrometer 500kHz - 5MHz, 3kV high voltage RF driver with high stability feedback High voltage driver for controlling electrodes in mass spectrometer, e-beam microscope High stability voltage reference (LTZ1000, LM399, ADR1000, ADR1399, 2DW232, REF70, LTC6655,…
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