- Test & Measurement Accessories
- System design assistance relates to
- microscopy
- optics (light, laser, charged particle, e-beam, ion-beam)
- scanning electron microscope
- mass spectrometer (ion trap, quadrupole, TOF)
- laser
- detector
- silicon electron detector (PIN diodes),
- microchannel plates (MCP)
- photomultiplier (PMT)
- Custom Design Analog/Mixed-Domain Electronics for instruments
- Low noise electronics
- transimpedance amplifier (TIA)
- fast settling detection driver
- ultra-low noise current driver
- RF driver for mass spectrometer
- 500kHz - 5MHz, 3kV high voltage RF driver with high stability feedback
- High voltage driver for controlling electrodes in mass spectrometer, e-beam microscope
- High stability voltage reference (LTZ1000, LM399, ADR1000, ADR1399, 2DW232, REF70, LTC6655, etc). Capable of delivery sub-ppm noise level performance.
- High stability voltage source (AD5791, AD5790, DAC11001)
- >20-bit high resolution ADC acquisition system (LTC2378 and its siblings, various more sigma-delta converters.)
- High-speed electronics
- >1GHz amplifier for sensor signal conditioning
- <100ps rise/fall time pulse/impulse generator
- >2GSPS 16-bit DAC (LTC2000)
- Portable Test & Measurement Electronics
- Battery power/backup
- Microcontroller programming
- Communication via USB/UART/RS232/RS485
- Low noise switching power supplies for sensitive analog load
- EMI control
- Export in control EMI on a multi-layer board and minimize inner board interference to achieve switching-glitch-free signal chain. You see the true 1nV/rtHz noise floor on mixed-domain PCB
- Expert in reduce PCB number of layers in complex mixed-domain data acquisition electronics, while maintaining EMI robustness
- Complexity reduction
- Elimination of redundant interface
- System complexity reduction to improve reliability and robustness, subsequently also reduce cost
- Cost reduction
- BOM item merging for non-critical session
- Components selection of easy of manufacturing
- Off-shore electronics assembly
